SPIT-IEEE Colloquium 2007-2008

Index By : Image Processing | VLSI and Embedded Systems | Communication and Networking | Data Mining | Information Security | Authors

Papers by Author : Swain, Santosh Kumar


Generation of Test Scenarios using Activity Diagram
Nanda, P.. ; Swain, Santosh Kumar. ; Mohapatra, D. P.. ;
SPIT-261 Full Text: PDF